ALEXANDRIA, Va., July 3 -- United States Patent no. 12,349,572, issued on July 1, was assigned to SAMSUNG DISPLAY Co. LTD. (Yongin-si, South Korea). "Display device and method of manufacturing the sa... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,343,332, issued on July 1, was assigned to ADAMED PHARMA S.A. (Czosnow, Poland). "Treatment of a bacterial vaginal infection" was invented by Sy... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,346,670, issued on July 1, was assigned to Suvoda LLC (Conshohocken, Pa.). "Systems and methods for generation of a tenant-specific service for ... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,346,658, issued on July 1, was assigned to Snowflake Inc. (Bozeman, Mont.). "Natural language processing text-image-layout transformer" was inve... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,343,364, issued on July 1, was assigned to GENMONT BIOTECH INCORPORATION (Tainan, Taiwan). "Lactobacillus reuteri GMNL-263 for improving hyperte... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,343,732, issued on July 1, was assigned to Rubble Master HMH GmbH (Linz, Austria). "Method for controlling a crusher having a crushing tool and ... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,344,301, issued on July 1, was assigned to WONDERLAND SWITZERLAND AG (Steinhausen, Switzerland). "Pivotal joint structure and stroller therewith... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,348,871, issued on July 1, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Electronic device having flexible display, and... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,346,416, issued on July 1, was assigned to NCHAIN LICENSING AG (Zug, Switzerland). "Method and system for verifying integrity of a digital asset... Read More
ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,659, issued on July 1, was assigned to SHIN-ETSU HANDOTAI Co. LTD. (Tokyo). "Method for measuring DIC defect shape on silicon wafer and poli... Read More